Dense switching matrices
Reed relays can route many instrument channels in a compact load-board, probe-card or switching-matrix architecture.
Semiconductor test systems need dense, repeatable switching with low leakage, stable contact behavior and controlled parasitics for wafer sort, package test, ICT and device characterization.
Reed relays can route many instrument channels in a compact load-board, probe-card or switching-matrix architecture.
Low leakage, high insulation resistance and stable contact behavior help protect small-current and high-impedance measurements.
Modular relay banks simplify fixture maintenance and support multiple DUT families.
Route SMU, DMM, LCR or high-voltage stress channels to selected pins while guarding sensitive nodes.
Switch test nodes, boundary conditions and stimulus lines in production fixtures.
Support controlled channel selection for stress, monitoring and validation equipment.
Use relay matrices to compare devices, isolate channels and automate repetitive measurements.
Send voltage, current, load type, coil voltage, package constraints and target application. MiRelay can recommend a standard series or custom design path.
Share your voltage, current, footprint, and lifecycle requirements. Our engineering team will recommend the optimal solution.